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arXiv 1102.5526cond-mat.mtrl-sci
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带可动电荷顺电材料的纳米尺度机电学:SrTiO3薄膜机电响应的尺寸效应和非线性

Nanoscale Electromechanics of Paraelectric Materials with Mobile Charges: Size effects and Nonlinearity of Electromechanical Response of SrTiO3 Films

A. N. Morozovska, E. A. Eliseev, G. S. Svechnikov, S. V. Kalinin

摘要:

纳米尺度使材料中禁止或可忽略的广泛机电耦合机制成为可能。我们进行了一个理论研究的机电响应的薄膜顺电薄膜与移动空位(或离子)范例的电容器型测量在X射线散射,piezoresponse力显微镜(PFM),和电化学应变显微镜(ESM)。利用量子顺电SrTiO_3薄膜作为模型材料,研究了电致伸缩、Maxwell应力、挠曲电效应、形变势以及由空位(或离子)和电子引起的组分Vegard应变对薄膜机电响应的影响。局部机电响应表现出强烈的尺寸效应,其规模是由SrTiO 3膜的厚度和PFM/ESM尖端尺寸的载流子屏蔽半径的比率。由于量子顺电体中固有的强介电非线性效应,SrTiO 3薄膜的机电响应对施加电压的依赖性表现出明显的交叉,从线性到二次律,然后到次线性律,在电压增加下具有2/3的因子。由介电磁化率和屏蔽半径之间的相互作用确定的机电响应的温度依赖性是非单调的,并且具有明显的最大值,其位置和宽度可以通过膜厚度来调谐。该研究为非压电纳米系统的机电耦合分析提供了一个比较框架。

英文摘要:

Nanoscale enables a broad range of electromechanical coupling mechanisms that are forbidden or negligible in the materials. We conduct a theoretical study of the electromechanical response of thin paraelectric films with mobile vacancies (or ions) paradigmatic for capacitor-type measurements in X-ray scattering, piezoresponse force microscopy (PFM), and electrochemical strain microscopy (ESM). Using quantum paraelectric SrTiO3 film as a model material with well known electromechanical, electronic and electrochemical properties, we evaluate the contributions of electrostriction, Maxwell stress, flexoelectric effect, deformation potential and compositional Vegard strains caused by mobile vacancies (or ions) and electrons to the electromechanical response. The local electromechanical response manifests strong size effects, the scale of which is determined by the ratio of the SrTiO3 film thickness and PFM/ESM tip size to the carriers screening radius. Due to the strong dielectric nonlinearity effect inherent in quantum paraelectrics, the dependence of the SrTiO3 film electromechanical response on applied voltage demonstrates a pronounced crossover from the linear to the quadratic law and then to the sub-linear law with a factor of 2/3 under the voltage increase. The temperature dependence of the electromechanical response as determined by the interplay between the dielectric susceptibility and the screening radius is non-monotonic and has a pronounced maxima, the position and width of which can be tuned by film thickness. This study provides a comparative framework for analysis of electromechanical coupling in the non-piezoelectric nanosystems.

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