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arXiv 1012.0660nucl-ex
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通过特征X射线探测确定反应截面:天体物理γ过程的169 Tm上α诱导反应

Determining reaction cross sections via characteristic X-ray detection: α-induced reactions on 169Tm for the astrophysical γ -process

G. G. Kiss, T. Rauscher, T. Szücs, Zs. Kertész, Zs. Fülöp, Gy. Gyürky, C. Fröhlich, J. Farkas, Z. Elekes, E. Somorjai

摘要:

利用探测172,173 Lu电子俘获衰变后的特征X射线辐射的新方法,首次测量了169 Tm(α,γ)173 Lu和169 Tm(α,n)172 Lu反应截面。尽管反应产物的半衰期相对较长(T1/2分别为500和6.7天),但可以测量169 Tm(α,γ)173 Lu反应的截面,接近伽莫夫窗口(T9 = 3.5 GK),在Ec.m. = 13.16和17.08 MeV。用电子转移光谱法测定了~(169)Tm(α,n)~(172)Lu的反应截面。= 11.21 MeV,最高达EC. m。= 17.08 MeV。实验结果与理论预测进行了比较

英文摘要:

The cross sections of the 169Tm(α, γ)173Lu and 169Tm(α,n)172Lu reactions have been measured first time using a new method, by detecting the characteristic X-ray radiation following the electron capturedecay of 172,173Lu. Despite the relatively long half-life of the reaction products (T1/2 = 500 and 6.7 days, respectively) it was possible to measure the cross section of the 169Tm(α,γ)173Lu reaction close to the Gamow window (T9 = 3.5 GK), between Ec.m. = 13.16 and 17.08 MeV. The 169Tm(α,n)172Lu reaction cross section was measured from Ec.m. = 11.21 MeV up to Ec.m. = 17.08 MeV. The experimental results have been compared to theoretical predictions

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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