arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1006.4430cond-mat.mes-hall
收藏

还原氧化石墨烯片中具有指数陷阱分布的空间电荷限制导电

Space charge limited conduction with exponential trap distribution in reduced graphene oxide sheets

Daeha Joung, A. Chunder, Lei Zhai, Saiful I. Khondaker

摘要:

通过测量和分析与温度相关的电流-电压特性,阐明了化学还原氧化石墨烯(RGO)片的低迁移率和电荷陷阱。通过介电泳将RGO片组装在源电极和漏电极之间。在低偏置电压下,导电是欧姆的,而在高偏置电压和低温下,导电变成空间电荷限制的陷阱的指数分布。我们估计平均陷阱密度为1.75x10^16 cm^-3。有关电荷陷阱的定量信息将有助于开发钝化缺陷的优化策略,以制造高质量的溶液处理石墨烯器件。

英文摘要:

We elucidate on the low mobility and charge traps of the chemically reduced graphene oxide (RGO) sheets by measuring and analyzing temperature dependent current-voltage characteristics. The RGO sheets were assembled between source and drain electrodes via dielectrophoresis. At low bias voltage the conduction is Ohmic while at high bias voltage and low temperatures the conduction becomes space charge limited with an exponential distribution of traps. We estimate an average trap density of 1.75x10^16 cm^-3. Quantitative information about charge traps will help develop optimization strategies of passivating defects in order to fabricate high quality solution processed graphene devices.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑