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arXiv 1002.4069cond-mat.mtrl-sci
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极低温下Si:P相干时间的脉冲ESR测量

Pulsed ESR Measurement of Coherence Times in Si:P at Very Low Temperatures

W. D. Hutchison, L. K. Alexander, N. Suwuntanasarn, G. N. Milford

摘要:

本文用自行设计的X波段毫开尔文脉冲ESR系统测量了同位素纯度为99.92%的28硅中磷施主自旋的退相干时间。在4.2K和0.9K下,孤立的P自旋T_2分别为260(50)ms和330(100)ms。

英文摘要:

A purpose built millikelvin pulsed x-band ESR system is used to measure spin decoherence times of phosphorus donor spins in 99.92% isotopically pure 28 silicon. The isolated P spin T2 is estimated at 260 (50) ms at 4.2 K and 330 (100) ms at 0.9 K.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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