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arXiv 1002.2179cond-mat.mtrl-sci
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高折射率衬底上(Ga,Mn)As的应变、磁各向异性和各向异性磁电阻:应用于(113)A取向层

Strain, magnetic anisotropy, and anisotropic magnetoresistance in (Ga,Mn)As on high-index substrates: application to (113)A-oriented layers

L. Dreher, D. Donhauser, J. Daeubler, M. Glunk, C. Rapp, W. Schoch, R. Sauer, W. Limmer

摘要:

基于一个详细的理论研究的晶格畸变在高指数外延层的连续介质力学方面,表达式推导出允许的应变张量的计算和实验测定(hhl)取向的(Ga,Mn)As层。推导了单斜和正交晶体对称性下应变相关的自由能量密度和电阻率张量的解析表达式,分别用相应的各向异性和电阻率参数唯象地描述了磁各向异性(MA)和各向异性磁阻(AMR).将结果应用于具有单斜晶体对称性的(113)A取向,使用该表达式通过高分辨率X射线衍射确定一系列(113)A取向的(Ga,Mn)As层的应变张量和剪切角,并通过角度相关磁输运探测4.2 K下的MA和AMR。而横向电阻率参数几乎不受磁场的影响,描述纵向电阻率的参数是强烈的场依赖性。

英文摘要:

Based on a detailed theoretical examination of the lattice distortion in high-index epilayers in terms of continuum mechanics, expressions are deduced that allow the calculation and experimental determination of the strain tensor for (hhl)-oriented (Ga,Mn)As layers. Analytical expressions are derived for the strain-dependent free-energy density and for the resistivity tensor for monoclinic and orthorhombic crystal symmetry, phenomenologically describing the magnetic anisotropy (MA) and anisotropic magnetoresistance (AMR) by appropriate anisotropy and resistivity parameters, respectively. Applying the results to (113)A orientation with monoclinic crystal symmetry, the expressions are used to determine the strain tensor and the shear angle of a series of (113)A-oriented (Ga,Mn)As layers by high-resolution x-ray diffraction and to probe the MA and AMR at 4.2 K by means of angle-dependent magnetotransport. Whereas the transverse resistivity parameters are nearly unaffected by the magnetic field, the parameters describing the longitudinal resistivity are strongly field dependent.

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