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arXiv 1001.3909cond-mat.mtrl-sci
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Ga1-xMnxAs场效应结构中居里温度与空穴浓度的关系

Curie temperature versus hole concentration in field-effect structures of Ga1-xMnxAs

Y. Nishitani, D. Chiba, M. Endo, M. Sawicki, F. Matsukura, T. Dietl, H. Ohno

摘要:

研究了铁磁半导体(Ga,Mn)As薄膜中居里温度TC与空穴浓度p的关系。的磁性探测的运输测量和P是通过应用程序的外部电场中的场效应晶体管配置。结果表明,在较宽的Mn组分和沟道厚度范围内,TC与p^γ成正比,指数γ= 0.19 \pm 0.02。伽马的大小是由一个p-d齐纳模型考虑到沿生长方向的不均匀的空穴分布,由界面状态和施加的栅极电场。

英文摘要:

The Curie temperature TC is investigated as a function of the hole concentration p in thin films of ferromagnetic semiconductor (Ga,Mn)As. The magnetic properties are probed by transport measurements and p is varied by the application of an external electric field in a field-effect transistor configuration. It is found that TC is proportional to p^γ, where the exponent γ= 0.19 \pm 0.02 over a wide range of Mn compositions and channel thicknesses. The magnitude of gamma is reproduced by a p-d Zener model taking into account nonuniform hole distribution along the growth direction, determined by interface states and the applied gate electric fields.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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