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arXiv 1001.2674cond-mat.mtrl-sci
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用磁性和光学方法测定氧化物半导体中纳米颗粒的尺寸和特性

On Using Magnetic and optical methods to determine the size and characteristics of nanoparticles embedded in oxide semiconductors

Gillian A. Gehring, Harry J. Blythe, Qi Feng, David S. Score, Abbas Mokhtari, Marzook Alshammari, Mohammed S. Al Qahtani, A. Mark Fox

摘要:

通常认为掺杂有过渡金属的氧化物膜具有磁性夹杂物。描述了确定纳米相的量及其磁特性的磁性方法。也可以测量顺磁性样品的量。光学方法进行了描述,并示出是非常强大的,以确定哪些缺陷也是磁性的。

英文摘要:

Films of oxides doped with transition metals are frequently believed to have magnetic inclusions. Magnetic methods to determine the amount of nanophases and their magnetic characteristics are described. The amount of the sample that is paramagnetic may also be measured. Optical methods are described and shown to be very powerful to determine which defects are also magnetic.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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