arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 0911.0097physics.opticsphysics.ins-det
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使用简单的、线性的、零延迟的光谱剪切干涉测量法实现光学频率梳和任意波形的自参考特性

Self-referenced characterization of optical frequency combs and arbitrary waveforms using a simple, linear, zero-delay implementation of spectral shearing interferometry

V. R. Supradeepa, Christopher M. Long, Daniel E. Leaird, Andrew M. Weiner

摘要:

讨论了一种简单、线性、零延迟的频谱剪切干涉测量方法,用于表征光学频率梳源和任意波形的振幅和相位。我们证明了这种技术,通过表征两个不同的高重复率(~10 GHz)的频率梳状源,分别产生强外部和腔内相位调制的连续波激光。该技术易于实现,只需要一个强度调制器和一个光谱分析仪(OSA),并被证明工作在平均功率水平下降到100 nW(10 aJ/脉冲在10 GHz)。通过利用这些频率梳的长相干长度和测量的自参考性质,我们还展示了一个简单的单端测量长光纤(> 25 km)中的色散和色散斜率。

英文摘要:

We discuss a simple, linear, zero-delay implementation of spectral shearing interferometry for amplitude and phase characterization of optical frequency comb sources and arbitrary waveforms. We demonstrate this technique by characterizing two different high repetition rate (~10 GHz) frequency comb sources, generated respectively by strong external and intracavity phase modulation of a continuous-wave laser. This technique is easy to implement, requiring only an intensity modulator and an optical spectrum analyzer (OSA), and is demonstrated to work at average power levels down to 100nW (10aJ/pulse at 10 GHz). By exploiting the long coherence lengths of these frequency combs and the self-referenced nature of the measurement, we also demonstrate a simple single-ended measurement of dispersion and dispersion slope in long lengths of fiber (>25km).

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