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arXiv 0909.3434cond-mat.mtrl-scicond-mat.mes-hall
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单个钴纳米线的质量密度

Mass Density of Individual Cobalt Nanowires

L. Philippe, B. Cousin, Zhao Wang, D. F. Zhang, J. Michler

摘要:

纳米线的质量密度确定使用准静态纳米拉伸试验相结合的原位共振频率实验。我们的研究结果表明,平均质量密度为7.36 g/cm 3,低于散装钴的理论密度。此外,电沉积的钴纳米线的密度被发现随着纵横比的降低。结果进行了讨论的测量精度和纳米线的微观结构。

英文摘要:

The mass density of nanowires is determined using in-situ resonance frequency experiments combined with quasi-static nanotensile tests. Our results reveal a mass density of 7.36 g/cm3 on average which is below the theoretical density of bulk cobalt. Also the density of electrodeposited cobalt nanowires is found to decrease with the aspect ratio. The results are discussed in terms of the measurement accuracy and the microstructure of the nanowires.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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