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arXiv 0909.0964cond-mat.supr-concond-mat.mtrl-sci
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超导微桥中的两级耗散:实验与模拟

Two-stage dissipation in a superconducting microbridge: Experiment and modeling

L. Del Rio, E. Altshuler, S. Niratisairak, O. Haugen, T. H. Johansen, B. A. Davidson, G. Testa, E. Sarnelli

摘要:

本文用荧光显微热成像技术研究了载流YBa_2Cu_3O_x超导桥I-V曲线中“两步”行为的起因。高分辨率温度图显示,随着施加电流的增加,电压中的第一步对应于局部耗散(热点),而第二步与整个桥的全局耗散的开始相关。实验结果的定量解释提供了一个简单的模型为非均匀超导体,假设热点成核的位置稍微压抑的超导性能。

英文摘要:

Using fluorescent microthermal imaging we have investigated the origin of "two-step" behavior in I-V curves for a current-carrying YBa_2Cu_3O_x superconducting bridge. High resolution temperature maps reveal that as the applied current increases the first step in the voltage corresponds to local dissipation (hot spot), whereas the second step is associated with onset of global dissipation throughout the entire bridge. A quantitative explanation of the experimental results is provided by a simple model for an inhomogeneous superconductor, assuming that the hot spot nucleates at a location with slightly depressed superconducting properties.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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