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arXiv 0907.3089cond-mat.mes-hallcond-mat.mtrl-sci
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拓扑控制:系统控制Bi2Te3表面的拓扑绝缘体狄拉克费米子密度

Topological Control: Systematic control of topological insulator Dirac fermion density on the surface of Bi2Te3

Y. Xia, D. Qian, D. Hsieh, R. Shankar, H. Lin, A. Bansil, A. V. Fedorov, D. Grauer, Y. S. Hor, R. J. Cava, M. Z. Hasan

摘要:

三维(3D)拓扑绝缘体是具有自旋-轨道诱导的体绝缘带隙的量子材料,其在不存在外加磁场的情况下表现出量子霍尔现象。拓扑绝缘体在器件几何结构中的拟议应用依赖于在狄拉克节点附近调节其表面上的化学势的能力。在这里,我们展示了一套基于光掺杂和分子掺杂相结合的表面控制方法,以系统地调整Bi 2 Te 3的拓扑(111)表面上的狄拉克费米子密度。它们的功效通过使用高分辨率角分辨光电子能谱(ARPES)的直接电子结构拓扑测量来证明。这些结果为探索Bi 2 Te 3表面Dirac电子的拓扑行为提供了新的机会。这里所示的方法中的至少一种可以成功地应用于其他拓扑绝缘体,例如Bi{1-x}Sb{x}、Sb 2 Te 3和Bi 2Se 3,这些将在别处示出。更重要的是,我们的拓扑表面状态操纵的方法在这里展示了非常适合未来的拓扑现象,这将补充从传统的电门控技术获得的传输结果的光谱研究。

英文摘要:

Three dimensional (3D) topological insulators are quantum materials with a spin-orbit induced bulk insulating gap that exhibit quantum-Hall-like phenomena in the absence of applied magnetic fields. The proposed applications of topological insulators in device geometries rely on the ability to tune the chemical potential on their surfaces in the vicinity of the Dirac node. Here, we demonstrate a suite of surface control methods based on a combination of photo-doping and molecular-doping to systematically tune the Dirac fermion density on the topological (111) surface of Bi2Te3. Their efficacy is demonstrated via direct electronic structure topology measurements using high resolution angle-resolved photoemission spectroscopy (ARPES). These results open up new opportunities for probing topological behavior of Dirac electrons on the Bi2Te3 surface. At least one of the methods demonstrated here can be successfully applied to other topological insulators such as the Bi{1-x}Sb{x}, Sb2Te3 and Bi2Se3 which will be shown elsewhere. More importantly, our methods of topological surface state manipulation demonstrated here are highly suitable for future spectroscopic studies of topological phenomena which will complement the transport results gained from the traditional electrical gating techniques.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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