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arXiv 0906.0212quant-ph
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弱测量和量子擦除的几何问题

Geometrical aspects of weak measurements and quantum erasers

Shuhei Tamate, Hirokazu Kobayashi, Toshihiro Nakanishi, Kazuhiko Sugiyama, Masao Kitano

摘要:

我们研究了弱测量的机制,通过使用干涉框架。为了恰当地阐明弱测量中的干涉效应,我们引入了一种用于具有内自由度粒子的干涉仪。它是量子擦除器和弱测量的共同框架。我们证明了几何相位,特别是Pancharatnam相位,结果从后选择的内部状态,从而改变干涉图案。结果表明,探测波包在弱测量下的异常位移是由于后选择效应引起的潘查拉特南相位引起的。

英文摘要:

We investigate the mechanism of weak measurement by using an interferometric framework. In order to appropriately elucidate the interference effect that occurs in weak measurement, we introduce an interferometer for particles with internal degrees of freedom. It serves as a framework common to quantum eraser and weak measurement. We demonstrate that the geometric phase, particularly the Pancharatnam phase, results from the post-selection of the internal state, and thereby the interference pattern is changed. It is revealed that the extraordinary displacement of the probe wavepackets in weak measurement is achieved owing to the Pancharatnam phase associated with post-selection.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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