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arXiv 0905.2916physics.ins-det
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Ne和Ne/CH4中的THGEM操作

THGEM operation in Ne and Ne/CH4

M. Cortesi, V. Peskov, G. Bartesaghi, J. Miyamoto, S. Cohen, R. Chechik, J. M. Maia, J. M. F. dos Santos, G. Gambarini, V. Dangendorf, A. Breskin

摘要:

厚气体电子倍增器(THGEM)在Ne和Ne/CH 4混合物中的操作,具有在相对低的操作电位下的高倍增因子,在单和双THGEM配置中。我们提出了一些系统的数据测量与紫外光子和软X射线,在各种Ne混合物。它包括增益对孔径和气体纯度的依赖性,从CsI光电阴极到气体中的光电子提取效率,长期增益稳定性和脉冲上升时间。给出了100 × 100 mm^2 X射线成像探测器的位置分辨率。讨论了可能的应用。

英文摘要:

The operation of Thick Gaseous Electron Multipliers (THGEM) in Ne and Ne/CH4 mixtures, features high multiplication factors at relatively low operation potentials, in both single- and double-THGEM configurations. We present some systematic data measured with UV-photons and soft x-rays, in various Ne mixtures. It includes gain dependence on hole diameter and gas purity, photoelectron extraction efficiency from CsI photocathodes into the gas, long-term gain stability and pulse rise-time. Position resolution of a 100x100 mm^2 X-rays imaging detector is presented. Possible applications are discussed.

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