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arXiv 1801.00533physics.ins-dethep-ex

Measurements of charging-up processes in THGEM-based particle detectors

M. Pitt, P. M. M. Correia, S. Bressler, A. E. C. Coimbra, D. Shaked Renous, C. D. R. Azevedo, J. F. C. A. Veloso, A. Breskin

英文摘要:

The time-dependent gain variation of detectors incorporating Thick Gas Electron Multipliers (THGEM) electrodes was studied in the context of charging-up processes of the electrode's insulating surfaces. An experimental study was performed to examine model-simulation results of the aforementioned phenomena, under various experimental conditions. The results indicate that in a stable detector's environment, the gain stabilization process is mainly affected by the charging-up of the detector's insulating surfaces caused by the avalanche charges. The charging-up is a transient effect, occurring during the detector's initial operation period; it does not affect its long-term operation. The experimental results are consistent with the outcome of model-simulations.

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