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arXiv 0905.0309cond-mat.mes-hall
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自组装量子点的微波电容探测

Probing microwave capacitance of self-assembled quantum dots

Guanglei Cheng, Jeremy Levy, Gilberto Medeiros-Ribeiro

摘要:

自组装量子点具有优异的光学、电子和自旋电子学特性,是量子信息技术的重要候选材料。它们的特性需要快速和本地的决定都电荷和自旋自由度。我们提出了一种方法来探测在微波频率的量子点的小合奏的电容。该技术采用基于微波微带谐振器的电容传感器,其灵敏度为~10^(-19)F/rt(Hz),足以探测单个电子。这种设计在扫描显微镜中的集成将为研究自组装量子点系统中的单电荷和自旋动力学提供重要工具。

英文摘要:

Self-assembled quantum dots have remarkable optical, electronic and spintronic properties that make them leading candidates for quantum information technologies. Their characterization requires rapid and local determination of both charge and spin degrees of freedom. We present a way to probe the capacitance of small ensembles of quantum dots at microwave frequencies. The technique employs a capacitance sensor based on a microwave microstrip resonator with sensitivity ~10^(-19) F/rt(Hz), high enough to probe single electrons. The integration of this design in a scanning microscope will provide an important tool for investigating single charge and spin dynamics in self-assembled quantum dot systems.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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