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arXiv 0910.0480cond-mat.mes-hall
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InAs/InP自组装量子点族的载流子热逃逸

Carrier thermal escape in families of InAs/InP self-assembled quantum dots

Guillaume Gélinas, Ali Lanacer, Richard Leonelli, Remo A. Masut, Sylvain Raymond, Philip J. Poole

摘要:

我们研究了InAs/InP(001)自组装量子点的多峰光致发光的热猝灭。在10 ~ 300 K温度范围内,研究了两种样品的光致发光谱随温度的变化规律。我们开发了一个耦合的速率方程模型,其中包括载流子的热逃逸从量子点的润湿层和InP矩阵的效果,其次是运输,夺回或非辐射复合。我们的模型再现了每个家庭的量子点与一组参数的发射的温度依赖性。我们发现量子点中载流子的主要逃逸机制是通过热发射到润湿层。这个过程的活化能被发现是接近一半的能量之间的差异,一个给定的家庭的量子点和润湿层的光致发光激发实验测量。这表明电子和空穴作为相关对离开InAs量子点。

英文摘要:

We investigate the thermal quenching of the multimodal photoluminescence from InAs/InP (001) self-assembled quantum dots. The temperature evolution of the photoluminescence spectra of two samples is followed from 10 K to 300 K. We develop a coupled rate-equation model that includes the effect of carrier thermal escape from a quantum dot to the wetting layer and to the InP matrix, followed by transport, recapture or non-radiative recombination. Our model reproduces the temperature dependence of the emission of each family of quantum dots with a single set of parameters. We find that the main escape mechanism of the carriers confined in the quantum dots is through thermal emission to the wetting layer. The activation energy for this process is found to be close to one-half the energy difference between that of a given family of quantum dots and that of the wetting layer as measured by photoluminescence excitation experiments. This indicates that electron and holes exit the InAs quantum dots as correlated pairs.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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