arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 0905.0251cond-mat.str-el
收藏

石墨烯中点缺陷引起的杂质带

Impurity band induced by point defects in graphene

Bor-Luen Huang, Chung-Yu Mou

摘要:

指出石墨烯上的点缺陷是强相关的,不能作为独立的散射体来处理。特别是,对于大的在位缺陷势,它表明,缺陷诱导的杂质带的状态密度的特征在于由维格纳半圆定律。我们发现,杂质带提高电导率的顺序为$4 e^2 /h $,并解释了没有强本地化。此外,杂质带支持铁磁性与感应磁矩接近1 $μ_B$每个缺陷在无限准粒子寿命的限制。

英文摘要:

It is pointed out that point defects on graphene are strongly correlated and can not be treated as independent scatters. In particular, for large on-site defect potential, it is shown that defects induce an impurity band with density of state characterized by the Wigner semi-circle law. We find that the impurity band enhances conductivity to the order of $4 e^2 /h $ and explains the absence of strong localization. Furthermore,the impurity band supports ferromagnetism with the induced magnetic moment approaching 1$μ_B$ per defect in the limit of infinite quasi-particle lifetime.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑