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arXiv 0812.4169cond-mat.mtrl-sci
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利用拉曼光谱探测悬浮石墨烯中的带电杂质

Probing charged impurities in suspended graphene using Raman spectroscopy

Zhen Hua Ni, Ting Yu, Zhi Qiang Luo, Ying Ying Wang, Lei Liu, Choun Pei Wong, Jian Min Miao, Wei Huang, Ze Xiang Shen

摘要:

带电杂质散射是影响石墨烯中载流子迁移率的主要因素之一。在本文中,我们使用拉曼光谱探测悬浮石墨烯中的带电杂质。我们发现2D带强度对石墨烯中的Cl浓度非常敏感,而G带强度不受影响。悬浮石墨烯的2D和G带之间的强度比I2 D/IG与非悬浮石墨烯相比强得多,这是由于前者中极弱的Cl散射。这一发现与最近的传输测量中观察到的悬浮石墨烯中的超高载流子迁移率一致。我们的结果还表明,在器件应用的关键的低Cl浓度下,I2 D/IG比是选择高质量单层石墨烯样品的比G带蓝移更好的标准。

英文摘要:

Charged impurity (CI) scattering is one of the dominant factors that affect the carrier mobility in graphene. In this paper, we use Raman spectroscopy to probe the charged impurities in suspended graphene. We find that the 2D band intensity is very sensitive to the CI concentration in graphene, while the G band intensity is not affected. The intensity ratio between the 2D and G bands, I2D/IG, of suspended graphene is much stronger compared to that of non-suspended graphene, due to the extremely weak CI scattering in the former. This finding is consistent with the ultra-high carrier mobility in suspended graphene observed in recent transport measurements. Our results also suggest that at low CI concentrations that are critical for device applications, the I2D/IG ratio is a better criterion in selecting high quality single layer graphene samples than is the G band blue shift.

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