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arXiv 0812.0831cond-mat.mtrl-sci
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InAs纳米线的电子迁移率与直径的关系

Diameter-Dependent Electron Mobility of InAs Nanowires

Alexandra Ford, Johnny Ho, Yu-Lun Chueh, Yu-Chih Tseng, Zhiyong Fan, Jing Guo, Jeffrey Bokor, Ali Javey

摘要:

单InAs纳米线场效应晶体管的温度依赖的I-V和C-V光谱被用来直接阐明作为纳米线半径的函数的本征电子输运性质。根据C-V表征,未处理的(即,没有任何表面功能化)纳米线,同时能够精确测量栅极氧化物电容;因此,导致直接评估电子的场效应迁移率。发现场效应迁移率随着半径减小到亚10 nm而单调减小,低温传输数据清楚地突出了表面粗糙度散射对小型化纳米线的迁移率退化的剧烈影响。更一般地说,这里提出的方法可以作为一个多功能和强大的平台,深入表征纳米级,电子材料。

英文摘要:

Temperature-dependent I-V and C-V spectroscopy of single InAs nanowire field-effect transistors were utilized to directly shed light on the intrinsic electron transport properties as a function of nanowire radius. From C-V characterizations, the densities of thermally-activated fixed charges and trap states on the surface of untreated (i.e., without any surface functionalization) nanowires are investigated while enabling the accurate measurement of the gate oxide capacitance; therefore, leading to the direct assessment of the field-effect mobility for electrons. The field-effect mobility is found to monotonically decrease as the radius is reduced to sub-10 nm, with the low temperature transport data clearly highlighting the drastic impact of the surface roughness scattering on the mobility degradation for miniaturized nanowires. More generally, the approach presented here may serve as a versatile and powerful platform for in-depth characterization of nanoscale, electronic materials.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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