arXivDaily arXiv每日学术速递 周一至周五更新
arXiv周末暂无论文更新,休息一下吧,周末愉快~~
arXiv 0810.5467physics.ins-dethep-exphysics.acc-ph
收藏

ATF2纳米束流尺寸监测仪的设计

Design of a Nanometer Beam Size Monitor for ATF2

Taikan Suehara, Masahiro Oroku, Takashi Yamanaka, Hakutaro Yoda, Tomoya Nakamura, Yoshio Kamiya, Yosuke Honda, Tatsuya Kume, Toshiaki Tauchi, Tomoyuki Sanuki, Sachio Komamiya

摘要:

我们开发了一种电子束尺寸监测器,用于测量极小的束流尺寸。它使用激光干涉条纹与电子束的散射目标。我们的目标性能是< 2 nm的系统误差为37 nm的光束尺寸和< 10%的统计误差,在测量中使用90个电子聚束为25 - 6000 nm的光束尺寸。一个精确的激光干涉条纹控制系统,使用主动反馈功能,被纳入到监视器,以实现目标性能。我们描述了一个整体的设计,实现和性能评估的监视器。

英文摘要:

We developed an electron beam size monitor for extremely small beam sizes. It uses a laser interference fringe for a scattering target with the electron beam. Our target performance is < 2 nm systematic error for 37 nm beam size and < 10% statistical error in a measurement using 90 electron bunches for 25 - 6000 nm beam size. A precise laser interference fringe control system using an active feedback function is incorporated to the monitor to achieve the target performance. We describe an overall design, implementations, and performance estimations of the monitor.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑