CESR-TA X射线束流尺寸监测仪编码孔径光学元件的设计和性能
Design and performance of coded aperture optical elements for the CESR-TA x-ray beam size monitor
摘要：
描述了CESR-TA储存环X射线束流尺寸监测器（xBSM）的光学元件的设计和性能。xBSM是一种测量$e^+$和$e^-$束流尺寸的装置。该装置可以在$\sim2-5~$ GeV的$e^\pm$束流能量下逐圈、逐束测量$10-100~μ$ m的垂直束流尺寸。由硬弯磁铁产生的X射线通过单缝或多缝（编码孔径）光学元件到达探测器。编码孔径狭缝图案和形成该图案的掩模材料的厚度都可以被调谐以获得最佳分辨率。我们描述了几个这样的光学元件，并显示如何以及简单的模型跟踪测量性能的预测。
英文摘要：
We describe the design and performance of optical elements for an x-ray beam size monitor (xBSM), a device measuring $e^+$ and $e^-$ beam sizes in the CESR-TA storage ring. The device can measure vertical beam sizes of $10-100~μ$m on a turn-by-turn, bunch-by-bunch basis at $e^\pm$ beam energies of $\sim2-5~$GeV. X-rays produced by a hard-bend magnet pass through a single- or multiple-slit (coded aperture) optical element onto a detector. The coded aperture slit pattern and thickness of masking material forming that pattern can both be tuned for optimal resolving power. We describe several such optical elements and show how well predictions of simple models track measured performances.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
