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arXiv 0806.1421cond-mat.supr-con
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超导薄膜临界温度附近精确微波谱的宽带方法

Broadband method for precise microwave spectroscopy of superconducting thin films near the critical temperature

H. Kitano, T. Ohashi, A. Maeda

摘要:

我们提出了一种高分辨率微波谱仪,用于测量超导薄膜在临界温度附近的频率依赖性复电导率。该仪器是基于一个宽带测量的复反射系数,$S_{\rm 11}$,同轴传输线,这是终止到一个薄膜样品与电极在科尔比诺盘形状。在临界温度附近,使用三种已知标准的标准校准技术不能提取由超导涨落引起的复电导率的强频率依赖性。这是因为短路和负载标准的$S_{\rm 11}$的相位部分之间的小的意外差异引起超导转变附近的复电导率的详细频率依赖性的大的误差。我们证明了一个新的校准程序,使用正常状态的电导率的样品作为负载标准解决了这个困难。该谱仪的高质量性能,它覆盖的频率范围在0.1 GHz和10 GHz之间,温度范围低至10 K,和磁场范围高达1 T,由几个薄膜的常规和高温超导体的实验结果说明。

英文摘要:

We present a high-resolution microwave spectrometer to measure the frequency-dependent complex conductivity of a superconducting thin film near the critical temperature. The instrument is based on a broadband measurement of the complex reflection coefficient, $S_{\rm 11}$, of a coaxial transmission line, which is terminated to a thin film sample with the electrodes in a Corbino disk shape. In the vicinity of the critical temperature, the standard calibration technique using three known standards fails to extract the strong frequency dependence of the complex conductivity induced by the superconducting fluctuations. This is because a small unexpected difference between the phase parts of $S_{\rm 11}$ for a short and load standards gives rise to a large error in the detailed frequency dependence of the complex conductivity near the superconducting transition. We demonstrate that a new calibration procedure using the normal-state conductivity of a sample as a load standard resolves this difficulty. The high quality performance of this spectrometer, which covers the frequency range between 0.1 GHz and 10 GHz, the temperature range down to 10 K, and the magnetic field range up to 1 T, is illustrated by the experimental results on several thin films of both conventional and high temperature superconductors.

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