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arXiv 0711.4089cond-mat.supr-concond-mat.str-el
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腔微扰法研究Pr $_{1.85}$ Ce $_{0.15}$ CuO $_{4-δ}$薄膜的复微波电导率

Complex microwave conductivity of Pr$_{1.85}$Ce$_{0.15}$CuO$_{4-δ}$ thin films using a cavity perturbation method

Guillaume Cote, Mario Poirier, Patrick Fournier

摘要:

本文报道了用腔微扰技术研究电子掺杂Pr $_{1.85}$ Ce $_{0.15}$ CuO $_{4-δ}$超导薄膜的微波电导率。采用Peligrad $\textit{et}$ $\textit{al.}$最近提出的高电导率极限,利用两种谐振模式,TE $_{102}$,(16.5GHz)和TE $_{101}$(13GHz)的相同腔,仅需要一个可调参数PDMATHAMT来将空腔的频移与加载有理想导体的腔的频移联系起来。此外,通过研究不同的样品配置,我们可以将基板上的频率偏移的比例因子。这些程序使我们能够提取的复杂的穿透深度和复杂的微波电导率的两个不同质量的薄膜的温度依赖性。我们的数据证实了超导态的所有物理性质都与具有节点线的序参量相一致。此外,我们证明了这些性能的高灵敏度的薄膜的质量。

英文摘要:

We report a study of the microwave conductivity of electron-doped Pr$_{1.85}$Ce$_{0.15}$CuO$_{4-δ}$ superconducting thin films using a cavity perturbation technique. The relative frequency shifts obtained for the samples placed at a maximum electric field location in the cavity are treated using the high conductivity limit presented recently by Peligrad $\textit{et}$ $\textit{al.}$ Using two resonance modes, TE$_{102}$ (16.5 GHz) and TE$_{101}$ (13 GHz) of the same cavity, only one adjustable parameter $Γ$ is needed to link the frequency shifts of an empty cavity to the ones of a cavity loaded with a perfect conductor. Moreover, by studying different sample configurations, we can relate the substrate effects on the frequency shifts to a scaling factor. These procedures allow us to extract the temperature dependence of the complex penetration depth and the complex microwave conductivity of two films with different quality. Our data confirm that all the physical properties of the superconducting state are consistent with an order parameter with lines of nodes. Moreover, we demonstrate the high sensitivity of these properties on the quality of the films.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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