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arXiv 0801.1790cond-mat.mtrl-scicond-mat.other
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漂移主导半导体自旋电子学器件中的自旋退相

Spin Dephasing in Drift-Dominated Semiconductor Spintronics Devices

Biqin Huang, Ian Appelbaum

摘要:

采用自旋输运模型研究了半导体自旋电子器件中由扩散驱动的渡越时间不确定性引起的自旋退相效应,其中漂移是主要的输运机制。据发现,在欧姆制度,失相是独立的渡越长度,并主要由跨自旋输运区的电压降。由该模型预测的电压和温度的影响进行了比较,从350微米厚的硅自旋输运器件使用衍生的自旋退相的数学表达式的实验结果。

英文摘要:

A spin transport model is employed to study the effects of spin dephasing induced by diffusion-driven transit-time uncertainty through semiconductor spintronic devices where drift is the dominant transport mechanism. It is found that in the ohmic regime, dephasing is independent of transit length, and determined primarily by voltage drop across the spin transport region. The effects of voltage and temperature predicted by the model are compared to experimental results from a 350-micron-thick silicon spin-transport device using derived mathematical expressions of spin dephasing.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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