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arXiv 0710.3891cond-mat.supr-con
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薄膜中Critical State响应的交流磁化率测量分析

Analysis of Critical State Response in Thin Films by ac Susceptibility Measurements

A. Youssef, Z. Svindrych, J. Hadac, Z. Janu

摘要:

对Nb薄膜的非线性交流极化率随温度的变化关系进行了谐波分析,得到的结果与基于二维圆盘滞回临界态模型计算的极化率吻合得很好。

英文摘要:

Harmonic analysis of the temperature dependence of the nonlinear ac susceptibility of Nb thin film gives excellent agreement with the susceptibility calculated on basis of model of the hysteretic critical state in 2D disk.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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