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arXiv 0705.3675cond-mat.mtrl-sci
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Ba0. 5Sr0.5TiO3薄膜相变的原位共振光电子能谱研究

Phase Change Observed in Ultrathin Ba0.5Sr0.5TiO3 Films by in-situ Resonant Photoemission Spectroscopy

Y. -H. Lin, K. Terai, H. Wadati, M. Kobayashi, M. Takizawa, J. I. Hwang, A. Fujimori, C. -W. Nan, J. -F. Li, S. -I. Fujimori, T. Okane, Y. Saitoh, K. Kobayashi

摘要:

采用脉冲激光沉积技术在Nb掺杂的SrTiO 3(100)衬底上制备了Ba 0. 5Sr 0. 5 TiO 3外延薄膜,并在室温和低温下测量了薄膜的Ti 2 p- 3d共振光电子能谱。结果表明,在2.8 nm(~7个单层)和2.0 nm(~5个单层)的Ba0.5Sr0.5TiO3薄膜中,光谱结构发生突变,表明在2.0 nm ~ 2.8 nm范围内存在相变临界厚度。这可能主要归因于固有的尺寸效应。

英文摘要:

Epitaxial Ba0.5Sr0.5TiO3 thin films were prepared on Nb-doped SrTiO3 (100)substrates by the pulsed laser deposition technique, and were studied by measuring the Ti 2p - 3d resonant photoemission spectra in the valence-band region as a function of film thickness, both at room temperature and low temperature. Our results demonstrated an abrupt variation in the spectral structures between 2.8 nm (~7 monolayers) and 2.0 nm (~5 monolayers) Ba0.5Sr0.5TiO3 films, suggesting that there exists a critical thickness for phase change in the range of 2.0 nm to 2.8 nm. This may be ascribed mainly to the intrinsic size effects.

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