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arXiv 0705.2600cond-mat.mtrl-sci
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重取向相变的厚度依赖性

Thickness Dependence of the Reorientation Phase Transition

David Clarke

摘要:

本文研究了垂直各向异性铁磁薄膜中重取向相变的厚度依赖性。也就是说,我们找到了均匀磁化的面内态的亚稳性的精确边界作为一组超越代数方程的解,并找到了垂直于薄膜平面方向上磁化的初始不稳定性的轮廓。一般来说,这种不稳定性发生在有限波数k处。我们确定的依赖性K上的膜厚度。

英文摘要:

This report examines the thickness dependence of the reorientation phase transition in ferromagnetic films with perpendicular anisotropy. That is, we find the exact boundary of metastability of uniformly magnetized in-plane states as the solution to a set of transcendental algebraic equations, and find the profile of the initial instability in the magnetization in the direction normal to the plane of the film. In general, this instability occurs at a finite wave number k. We determine the dependence of k on the film thickness.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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