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arXiv 0705.0259cond-mat.mes-hallcond-mat.other
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使石墨烯可见

Making graphene visible

P. Blake, K. S. Novoselov, A. H. Castro Neto, D. Jiang, R. Yang, T. J. Booth, A. K. Geim, E. W. Hill

摘要:

在许多实验研究中使用的石墨烯装置的微制造目前依赖于以下事实:如果在具有一定厚度的二氧化硅的硅晶片的顶部上制备,则石墨烯微晶可以使用光学显微镜来可视化。我们研究了石墨烯的可见性,并表明它强烈依赖于二氧化硅的厚度和光波长。我们已经发现,通过使用单色照明,石墨烯可以被分离用于任何二氧化硅厚度,尽管是300 nm(当前标准),并且特别是大约300 nm。100 nm最适合其目视检测。通过使用基于菲涅耳定律的模型,我们定量描述的实验数据没有任何拟合参数。

英文摘要:

Microfabrication of graphene devices used in many experimental studies currently relies on the fact that graphene crystallites can be visualized using optical microscopy if prepared on top of silicon wafers with a certain thickness of silicon dioxide. We study graphene's visibility and show that it depends strongly on both thickness of silicon dioxide and light wavelength. We have found that by using monochromatic illumination, graphene can be isolated for any silicon dioxide thickness, albeit 300 nm (the current standard) and, especially, approx. 100 nm are most suitable for its visual detection. By using a Fresnel-law-based model, we quantitatively describe the experimental data without any fitting parameters.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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