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arXiv 0704.3111cond-mat.str-elcond-mat.supr-con
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掺杂莫特绝缘体中临界掺杂附近集体电荷模的各向异性软化

Anisotropic softening of collective charge modes in the vicinity of critical doping in a doped Mott insulator

Y. W. Li, D. Qian, L. Wray, D. Hsieh, Y. Kaga, T. Sasagawa, H. Takagi, R. S. Markiewicz, A. Bansil, H. Eisaki, S. Uchida, M. Z. Hasan

摘要:

动量分辨非弹性共振X射线散射被用来映射电子掺杂的莫特绝缘体类Nd $_{2-x}$ Ce $_x$ CuO $_4$中的电荷激发在大范围的能量、动量和掺杂水平上的演化。随着掺杂诱导的AFM-SC(反铁磁-超导)转变的接近,我们观察到一个各向异性软化的集体电荷模式在一个大的能量尺度上沿伽马(π,π)-方向,而模式表现出展宽($\sim$ 1 eV)与相对较小的软化沿伽马(π,0)相对于父莫特绝缘体(x=0)。我们的研究表明,一个系统的崩溃的间隙一致的情况下,该系统均匀掺杂电子,即使软化的模式涉及一个异常大的能量尺度。

英文摘要:

Momentum resolved inelastic resonant x-ray scattering is used to map the evolution of charge excitations over a large range of energies, momenta and doping levels in the electron doped Mott insulator class Nd$_{2-x}$Ce$_x$CuO$_4$. As the doping induced AFM-SC (antiferromagnetic-superconducting) transition is approached, we observe an anisotropic softening of collective charge modes over a large energy scale along the Gamma to (π,π)-direction, whereas the modes exhibit broadening ($\sim$ 1 eV) with relatively little softening along Gamma to (π,0) with respect to the parent Mott insulator (x=0). Our study indicates a systematic collapse of the gap consistent with the scenario that the system dopes uniformly with electrons even though the softening of the modes involves an unusually large energy scale.

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