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arXiv quant-ph/9908021quant-ph
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Si MOSFET中耦合量子点量子门及其测量方法

Quantum gates by coupled quantum dots and measurement procedure in Si MOSFET

Tetsufumi Tanamoto

摘要:

从理论上研究了可以观察到充电效应时耦合量子点的量子门。我们已经表明,在量子比特的带电状态可以观察到的MOSFET结构的沟道电流。

英文摘要:

We investigated the quantum gates of coupled quantum dots, theoretically, when charging effects can be observed. We have shown that the charged states in the qubits can be observed by the channel current of the MOSFET structure.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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