概念验证的像素内偏振计的模型和制造
Model And Fabrication Of A Proof-Of-Concept Polarimeter-In-A-Pixel
摘要：
我提出了一种新的光电子器件，完全和即时测量入射光的偏振在一个单一的物理像素的窄波长带。该器件具有四个（或更多个）量子阱有源区，其由四个（或更多个）不同取向的线性光栅分隔和覆盖。对每个光栅和底部接触层进行电接触，以测量四个（或更多个）光电流。该装置利用许多光路之间的干涉，在四个光电流中编码四个值，这些值完全描述了给定波长下入射光的偏振状态。我从新设备的动机开始。然后，我报告两个计算模型：第一个包括完美的导电光栅，第二个包括更现实的介质光栅。接下来，我将描述双层概念验证设备的设计和处理。最后，我将叙述第一轮制造的试验。
英文摘要：
I propose a new optoelectronic device that completely and instantaneously measures the incident light's polarization for a narrow wavelength band in a single physical pixel. The device has four (or more) quantum-well active regions separated and topped by four (or more) linear gratings at different orientations. Electrical contact is made to each grating and to a bottom contact layer to measure four (or more) photocurrents. The device uses interference among many light paths to encode in four photocurrents four values that completely describe the polarization state of the incident light at a given wavelength. I begin with the motivation for the new device. Then, I report on two computational models: the first includes perfectly conducting gratings, and the second includes more realistic dielectric gratings. Next, I will describe the design and processing of a two-layer proof-of-concept device. Last, I will recount the trials of the first round of fabrication.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
