arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2607.03428cond-mat.mes-hallcond-mat.mtrl-sci
收藏

导电薄膜异质结构中接触起电长度尺度效应的证据

Evidence of length scale effect in contact electrification in conducting thin film heterostructures

University of California, Riverside(加州大学河滨分校);Birla Institute of Technology and Science Pilani, Dubai Campus(比拉理工科学研究所皮拉尼迪拜校区)

Paul C. Lou, Ravindra G. Bhardwaj, Anand Katailiha, W. P. Beyermann, Sandeep Kumar

AI总结:

研究导电材料接触起电的长度尺度效应,通过实验在坡莫合金和简并掺杂p-Si异质结构系统中证实因挠曲电介导接触起电产生该效应,还有电荷转移及金属-绝缘体转变,为调控材料物理性质提供新机会。

摘要:

两种导电材料间的接触起电预计会呈现长度尺度效应,因为屏蔽效应会随材料尺寸在导体中减弱。因此,界面电荷积累会随材料尺寸从界面/表面扩散到临界穿透深度。本文通过实验证明了坡莫合金和简并掺杂p-Si异质结构系统中由于挠曲电介导接触起电而产生的长度尺度效应。在400nm厚的p-Si样品中,观察到接触起电引起的层间电荷转移贯穿整个厚度。而在2μm厚的Si中,电荷载流子从界面扩散到51nm的深度。长度尺度效应在这两种情况下还导致p-Si层中的金属-绝缘体转变。这些结果为利用接触起电来定制导电材料的物理性质提供了新机会。

英文摘要:

Contact electrification between two conducting materials is expected to exhibit length scale effect because the screening effect will diminish in conductors as a function of material dimensions. As a consequence, the interfacial charge accumulation will diffuse away from interface/surface to a critical penetration depth as a function of material dimension. This work experimentally demonstrates the length scale effect in a permalloy and degenerately doped p-Si heterostructure system due to the flexoelectricity mediated contact electrification. The contact electrification induced interlayer charge transfer is observed through the whole thickness in case of 400 nm thick p-Si samples. Whereas, the charge carrier diffuses to a depth of 51 nm from the interface in case of 2 um thick Si. The length scale effect also leads to metal-insulator transition in p-Si layers in both cases. These results present a new opportunity to tailor the physical properties in conducting materials using contact electrification.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑