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arXiv 2603.08069cs.CV

利用多模态大语言模型生成合成缺陷图像用于电力线路绝缘子检测

Synthetic Defect Image Generation for Power Line Insulator Inspection Using Multimodal Large Language Models

Department of Electrical and Computer Engineering, Wayne State University(电气与计算机工程系,韦恩州立大学)

Xuesong Wang, Caisheng Wang

AI总结:

利用多模态大语言模型生成合成缺陷图像,提升电力线路绝缘子缺陷识别的准确率和数据效率。

摘要:

电力公司越来越多地依赖无人机图像进行事后和常规检查,但训练准确的缺陷类型分类器仍然困难,因为缺陷示例很少且检查数据集通常有限或专有。我们通过使用现成的多模态大语言模型(MLLM)作为无训练图像生成器来解决数据稀缺的问题,该模型可以基于视觉参考和文本提示合成缺陷图像。我们的流程通过双参考条件增加多样性,通过轻量级人工验证和提示优化提高标签保真度,并使用基于嵌入的筛选规则过滤所生成的合成池,该规则基于从真实训练集计算的类别质心的距离。我们在陶瓷绝缘子缺陷类型分类(壳 vs. 胶层)上评估,使用一个公开数据集,在现实的低训练数据情况下(104张真实训练图像;152张验证;308张测试)。将10%的真实训练集与基于嵌入选择的合成图像增强后,测试F1分数(精度和召回率的调和平均)从0.615提高到0.739(20%的提升),对应于估计的4-5倍的数据效率提升,且在更强的骨干模型和冻结特征线性探测基线中收益仍然存在。这些结果表明,当收集额外真实缺陷较慢或不可行时,提供了一条实用且低门槛的改进缺陷识别的方法。

英文摘要:

Utility companies increasingly rely on drone imagery for post-event and routine inspection, but training accurate defect-type classifiers remains difficult because defect examples are rare and inspection datasets are often limited or proprietary. We address this data-scarcity setting by using an off-the-shelf multimodal large language model (MLLM) as a training-free image generator to synthesize defect images from visual references and text prompts. Our pipeline increases diversity via dual-reference conditioning, improves label fidelity with lightweight human verification and prompt refinement, and filters the resulting synthetic pool using an embedding-based selection rule based on distances to class centroids computed from the real training split. We evaluate on ceramic insulator defect-type classification (shell vs. glaze) using a public dataset with a realistic low training-data regime (104 real training images; 152 validation; 308 test). Augmenting the 10% real training set with embedding-selected synthetic images improves test F1 score (harmonic mean of precision and recall) from 0.615 to 0.739 (20% relative), corresponding to an estimated 4--5x data-efficiency gain, and the gains persist with stronger backbone models and frozen-feature linear-probe baselines. These results suggest a practical, low-barrier path for improving defect recognition when collecting additional real defects is slow or infeasible.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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