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arXiv 2509.20946cs.CV

基于无监督学习的激光功率计传感器实时端侧缺陷检测框架

A Real-Time On-Device Defect Detection Framework for Laser Power-Meter Sensors via Unsupervised Learning

Purdue University(普渡大学);Carnegie Mellon University(卡内基梅隆大学);University of Pittsburgh(匹兹堡大学)

Dongqi Zheng, Wenjin Fu, Guangzong Chen

AI总结:

提出一种基于无监督学习的端侧缺陷检测框架,利用预处理、StyleGAN2增强和UFlow架构,在366张真实图像上实现93.8%缺陷准确率和0.957图像级AUROC,实现快速自动质检。

摘要:

我们提出了一种基于视觉的自动化系统,用于激光功率计传感器镀层的缺陷检测与分类。该方法解决了在医疗和工业应用中识别热损伤和划痕等镀层缺陷的关键挑战,这些缺陷可能影响激光能量测量的准确性。该系统采用无监督异常检测框架,仅使用“合格”传感器图像进行训练,以学习正常镀层的分布模式,从而无需大量标注缺陷数据集即可检测已知和新型缺陷类型。我们的方法包含三个关键组成部分:(1)使用拉普拉斯边缘检测和K-means聚类的稳健预处理流程,用于分割感兴趣区域;(2)通过StyleGAN2进行合成数据增强;(3)基于UFlow的神经网络架构,用于多尺度特征提取和异常图生成。对366张真实传感器图像的实验评估表明,缺陷样本的准确率为93.8%,合格样本的准确率为89.3%,图像级AUROC为0.957,像素级AUROC为0.961。该系统通过自动化质量控制可带来潜在的年成本节约,在端侧实现中每张图像的处理时间为0.5秒。

英文摘要:

We present an automated vision-based system for defect detection and classification of laser power meter sensor coatings. Our approach addresses the critical challenge of identifying coating defects such as thermal damage and scratches that can compromise laser energy measurement accuracy in medical and industrial applications. The system employs an unsupervised anomaly detection framework that trains exclusively on ``good'' sensor images to learn normal coating distribution patterns, enabling detection of both known and novel defect types without requiring extensive labeled defect datasets. Our methodology consists of three key components: (1) a robust preprocessing pipeline using Laplacian edge detection and K-means clustering to segment the area of interest, (2) synthetic data augmentation via StyleGAN2, and (3) a UFlow-based neural network architecture for multi-scale feature extraction and anomaly map generation. Experimental evaluation on 366 real sensor images demonstrates $93.8\%$ accuracy on defective samples and $89.3\%$ accuracy on good samples, with image-level AUROC of 0.957 and pixel-level AUROC of 0.961. The system provides potential annual cost savings through automated quality control and processing times of 0.5 seconds per image in on-device implementation.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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