Robust Anomaly Map Assisted Multiple Defect Detection with Supervised Classification Techniques

英文摘要：

Industry 4.0 aims to optimize the manufacturing environment by leveraging new technological advances, such as new sensing capabilities and artificial intelligence. The DRAEM technique has shown state-of-the-art performance for unsupervised classification. The ability to create anomaly maps highlighting areas where defects probably lie can be leveraged to provide cues to supervised classification models and enhance their performance. Our research shows that the best performance is achieved when training a defect detection model by providing an image and the corresponding anomaly map as input. Furthermore, such a setting provides consistent performance when framing the defect detection as a binary or multiclass classification problem and is not affected by class balancing policies. We performed the experiments on three datasets with real-world data provided by Philips Consumer Lifestyle BV.