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arXiv 2509.21561cs.CV

手术器械的无监督缺陷检测

Unsupervised Defect Detection for Surgical Instruments

Purdue University School of Electrical

Joseph Huang, Yichi Zhang, Jingxi Yu, Wei Chen, Seunghyun Hwang, Qiang Qiu, Amy R. Reibman, Edward J. Delp, Fengqing Zhu

AI总结:

针对手术器械缺陷检测中纹理背景导致误检、小缺陷灵敏度低及领域迁移问题,提出结合背景掩蔽、补丁分析和高效域适应的无监督方法。

摘要:

确保手术器械的安全性需要可靠地检测视觉缺陷。然而,人工检查容易出错,现有的自动缺陷检测方法通常在自然/工业图像上训练,无法有效迁移到手术领域。我们证明,简单地应用或微调这些方法会导致问题:纹理背景引起的误检、对微小缺陷的灵敏度低,以及由于域偏移导致的器械特定特征捕获不足。为了解决这些挑战,我们提出了一种通用方法,专门针对手术器械调整无监督缺陷检测方法。通过集成背景掩蔽、基于补丁的分析策略和高效的域适应,我们的方法克服了这些限制,能够可靠地检测手术器械图像中的细微缺陷。

英文摘要:

Ensuring the safety of surgical instruments requires reliable detection of visual defects. However, manual inspection is prone to error, and existing automated defect detection methods, typically trained on natural/industrial images, fail to transfer effectively to the surgical domain. We demonstrate that simply applying or fine-tuning these approaches leads to issues: false positive detections arising from textured backgrounds, poor sensitivity to small, subtle defects, and inadequate capture of instrument-specific features due to domain shift. To address these challenges, we propose a versatile method that adapts unsupervised defect detection methods specifically for surgical instruments. By integrating background masking, a patch-based analysis strategy, and efficient domain adaptation, our method overcomes these limitations, enabling the reliable detection of fine-grained defects in surgical instrument imagery.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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