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arXiv 2501.02101physics.app-phcond-mat.mtrl-sci
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高功率脉冲磁控溅射实现极化增强且低漏电的铁电AlScN薄膜

Ferroelectric AlScN thin films with enhanced polarization and low leakage enabled by high-power impulse magnetron sputtering

Federica Messi, Jyotish Patidar, Nathan Rodkey, Christoph W. Dräyer, Morgan Trassin, Sebastian Siol

AI总结:

本文提出用高功率脉冲磁控溅射(HiPIMS)在低温下合成高质量铁电AlScN薄膜,实现5 MV/cm矫顽场和158-172 μC/cm²的增强剩余极化,并验证其循环稳定性与低漏电特性,为CMOS兼容的非易失性存储器应用铺路。

摘要:

对高效数据处理的需求推动着向内存计算架构的转变。铁电材料,特别是AlScN,在下一代存储器件中展现出巨大前景。然而,其广泛应用受到高矫顽场、漏电流和有限稳定性等挑战的限制。我们的工作引入了一种利用高功率脉冲磁控溅射(HiPIMS)合成铁电AlScN薄膜的新方法。通过组合研究,我们考察了钪含量和衬底偏压对采用金属离子同步(MIS)HiPIMS沉积的AlScN薄膜铁电性能的影响。利用HiPIMS的高电离率和最优时序的衬底偏压电位,我们在低温下增强了吸附原子迁移率。我们的薄膜在低至250°C的温度下表现出高度的织构和结晶度以及低粗糙度。最重要的是,这些薄膜表现出与最先进水平相当的矫顽场(5 MV/cm),并具有显著增强的剩余极化(158-172.0 μC/cm²)。值得注意的是,剩余极化在不同钪浓度下保持稳定。我们进一步评估了循环稳定性和漏电流,以评估其在存储器应用中的适用性。本研究表明HiPIMS是一种可扩展且兼容CMOS的技术,可用于合成高质量铁电AlScN薄膜,为其在非易失性存储器应用中的应用铺平了道路。

英文摘要:

The demand for efficient data processing motivates a shift toward in-memory computing architectures. Ferroelectric materials, particularly AlScN, show great promise for next-generation memory devices. However, their widespread application is limited due challenges such as high coercive fields, leakage currents and limited stability. Our work introduces a novel synthesis approach for ferroelectric AlScN thin films using high-power impulse magnetron sputtering (HiPIMS). Through a combinatorial study, we investigate the effect of scandium content and substrate bias on the ferroelectric properties of AlScN films deposited using metal-ion synchronized (MIS) HiPIMS. Leveraging the high ionization rates of HiPIMS and optimally timed substrate bias potentials, we enhance the adatom mobility at low temperatures. Our films exhibit a high degree of texture and crystallinity as well as low roughness at temperatures as low as 250°C. Most importantly, the films exhibit coercive fields comparable to state-of-the-art values (5 MV/cm) with significantly enhanced remanent polarization (158-172.0 μC/cm2). Notably, the remanent polarization remains stable across varying scandium concentrations. We further evaluate cycling stability and leakage current to assess suitability for memory applications. This study demonstrates HiPIMS as a scalable and CMOS compatible technique for synthesizing high-quality ferroelectric AlScN films, paving the way for their application in non-volatile memory applications.

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