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arXiv 2408.07950math-phcond-mat.mes-hallmath.MPmath.SP
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弯曲界面的体边对应关系

The bulk-edge correspondence for curved interfaces

Alexis Drouot, Xiaowen Zhu

AI总结:

本研究将体边对应定理从直边界推广到弯曲边界情形,证明拓扑绝缘体边缘电导为霍尔电导的整数倍,该整数对应界面进入测量集的代数次数,为任意形状截断的拓扑绝缘体均存在边缘电流的实验观测提供严格证明。

摘要:

体边对应关系是凝聚态物理中的一个定理,它将半平面中霍尔绝缘体的电导与其(直)边界的电导联系起来。在本研究中,我们将这一结果推广到具有弯曲边界的区域。\n在温和的几何假设下,我们证明了拓扑绝缘体样品的边缘电导是其霍尔电导的整数倍。这个整数计数了界面(经适当定向)进入测量集的代数次数。该结果为一项著名的实验观测提供了严格证明:任意截断的拓扑绝缘体都能承载边缘电流,无论其边界形状如何。

英文摘要:

The bulk-edge correspondence is a condensed matter theorem that relates the conductance of a Hall insulator in a half-plane to that of its (straight) boundary. In this work, we extend this result to domains with curved boundaries. Under mild geometric assumptions, we prove that the edge conductance of a topological insulator sample is an integer multiple of its Hall conductance. This integer counts the algebraic number of times that the interface (suitably oriented) enters the measurement set. This result provides a rigorous proof of a well-known experimental observation: arbitrarily truncated topological insulators support edge currents, regardless of the shape of their boundary.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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