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arXiv 2408.05447cond-mat.mtrl-scicond-mat.softphysics.data-anphysics.optics
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关于如何确定表面粗糙度功率谱

On how to determine surface roughness power spectra

N. Rodriguez, L. Gontard, C. Ma, R. Xu, B. N. J. Persson

AI总结:

本文评估了不同实验方法测定表面粗糙度功率谱的可靠性,指出光学方法精度不足,而触针仪器和AFM结果可靠,并探讨了由一维功率谱推导二维功率谱的方法。

摘要:

解析接触力学理论通过表面粗糙度功率谱依赖于表面粗糙度。在本研究中,我们评估了各种用于研究表面粗糙度的实验方法的可用性。我们的研究结果表明,通过光学方法获得的高度数据通常缺乏准确性,不应用于计算表面粗糙度功率谱。相反,工程触针仪器和原子力显微镜(AFM)通常能产生可靠的结果,并且在重叠的粗糙度长度尺度区域内保持一致。对于具有各向同性粗糙度的表面,二维(2D)功率谱可以通过几种方法从一维(1D)功率谱推导出来,我们在本文中探讨了这些方法。

英文摘要:

Analytical contact mechanics theories depend on surface roughness through the surface roughness power spectrum. In the present study, we evaluated the usability of various experimental methods for studying surface roughness. Our findings indicated that height data obtained from optical methods often lack accuracy and should not be utilized for calculating surface roughness power spectra. Conversely, engineering stylus instruments and atomic force microscopy (AFM) typically yield reliable results that are consistent across the overlapping roughness length scale region. For surfaces with isotropic roughness, the two-dimensional (2D) power spectrum can be derived from the one-dimensional (1D) power spectrum using several approaches, which we explored in this paper.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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