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arXiv 2407.06751cs.ARcs.CR
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针对抗辐射TMR寄存器的激光故障注入攻击

Laser Fault Injection Attacks against Radiation Tolerant TMR Registers

Dmytro Petryk, Zoya Dyka, Ievgen Kabin, Anselm Breitenreiter, Jan Schaeffner, Milos Krstic

AI总结:

针对无线设备易遭故障注入攻击窃取密钥的问题,研究对IHP抗辐射三模冗余移位寄存器开展激光故障注入实验,成功注入多种瞬态故障,揭示了该类抗辐射TMR寄存器的安全漏洞。

摘要:

物联网(IoT)、无线传感器节点及其他接入网络进行数据交换的无线设备的安全要求很高。这类设备常成为实验室分析的目标,分析目的是窃取隐藏的秘密信息。光学故障注入攻击是获取加密密钥的一类攻击手段。本研究中,我们调研了由三模冗余触发器构成的IHP抗辐射移位寄存器。实验中,我们成功向TMR寄存器注入了多种瞬态故障。

英文摘要:

Security requirements for the Internet of things (IoT), wireless sensor nodes, and other wireless devices connected in a network for data exchange are high. These devices are often subject to lab analysis with the objective to reveal secret hidden information. One kind of attacks to reveal the cryptographic key is to perform optical Fault Injection attacks. In this work, we investigated the IHP radiation tolerant shift registers built of Triple Modular Redundant flip-flops. In our experiments, we were able to inject different transient faults into TMR registers.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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