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arXiv 2407.03220cond-mat.mes-hall
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平面缺陷对单磁畴纳米颗粒反转时间的影响

Impact of planar defects on the reversal time of single magnetic domain nanoparticles

Hugo Bocquet, Armin Kleibert, Peter M. Derlet

AI总结:

本文针对单磁畴fcc Co纳米颗粒,应用Langer热激活理论推导出含平面缺陷的磁弛豫时间解析式,揭示Arrhenius指数和前置因子均随系统尺寸及缺陷数呈指数依赖,为实验现象提供定量解释并强调结构缺陷对磁稳定性的关键作用。

摘要:

近期对单个磁性纳米颗粒的实验研究揭示了多种多样的磁弛豫时间,这些时间无法仅通过考虑其尺寸、形状和表面各向异性来解释,表明与颗粒内部微观结构相关的其他因素也在起作用。在本快报中,我们将Langer的热激活理论应用于具有平面缺陷实验微观结构的单磁畴面心立方钴纳米颗粒,并推导出弛豫时间的解析表达式。所得到的Arrhenius指数及其前置因子(通常被假定为常数)在此被发现均以指数形式依赖于系统尺寸和缺陷数量。二者共同为实验结果提供了定量预测,并且更广泛地凸显了在考虑磁稳定性时结构缺陷的重要性。

英文摘要:

Recent experimental investigations of individual magnetic nanoparticles reveal a diverse range of magnetic relaxation times which cannot be explained by considering their size, shape, and surface anisotropy, suggesting other factors associated with the internal microstructure of the particles are at play. In this letter, we apply Langer's theory of thermal activation to single magnetic domain fcc Co nanoparticles, whose experimental microstructures are characterized by planar defects, and derive an analytic expression for the relaxation time. The obtained Arrhenius exponential and its prefactor, which is often assumed to be a constant, are here found to both depend exponentially on system size and the number of defects. Together they provide a quantitative prediction of the experimental findings, and more generally highlight the importance of structural defects when considering magnetic stability.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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