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arXiv 2402.10084cond-mat.mtrl-sciphysics.optics
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利用多层电子叠层成像揭示上转换核壳纳米颗粒的三维结构

Uncovering the Three-Dimensional Structure of Upconverting Core-Shell Nanoparticles with Multislice Electron Ptychography

Stephanie M. Ribet, Georgios Varnavides, Cassio C. S. Pedroso, Bruce E. Cohen, Peter Ercius, Mary C. Scott, Colin Ophus

AI总结:

本研究利用多层电子叠层成像技术,在低电子剂量下重建上转换核壳纳米颗粒的三维结构,并绘制应变分布,揭示壳扭转及裂纹、位错位置,展示了单次扫描获取三维信息的优势。

摘要:

在光子上转换核壳纳米颗粒中,结构强烈决定性能。扫描透射电子显微镜中的常规成像具有足够的分辨率来探测这些纳米颗粒的原子结构,但衬度、剂量和投影限制使得常规成像模式不足以完全表征这些结构。相位恢复方法提供了一种有前景的替代成像模式,特别是多层电子叠层成像可以恢复深度相关信息。在此,我们采用低电子剂量以避免损伤的多层叠层成像方法,研究了束敏感的 光子上转换核壳纳米颗粒。由于核与壳之间晶格参数的不匹配,这些异质结构中产生了大的应变场。我们重建了一个看似无缺陷的纳米颗粒和一个侧面有较大断裂的纳米颗粒,并通过计算每个切片的高分辨率势像中的畸变场,绘制了三维应变分布。在无缺陷的纳米颗粒中,我们观察到壳的扭转,而在断裂的纳米颗粒中,我们测量了裂纹、核和位错的三维位置。这些结果突显了多层电子叠层成像在严格的电子剂量要求下,从单次扫描中恢复三维信息的优势,即使对于束敏感的样品也是如此。

英文摘要:

In photon upconverting core-shell nanoparticles, structure strongly dictates performance. Conventional imaging in scanning transmission electron microscopy has sufficient resolution to probe the atomic structure of these nanoparticles, but contrast, dose, and projection limitations make conventional imaging modes insufficient for fully characterizing these structures. Phase retrieval methods provide a promising alternative imaging mode, and in particular, multislice electron ptychography can recover depth-dependent information. Here, we study beam-sensitive photon upconverting core-shell nanoparticles with a multislice ptychography approach using a low electron dose to avoid damage. Large strain fields arise in these heterostructures due to the mismatch in lattice parameter between the core and the shell. We reconstruct both a nanoparticle that appears defect-free and one that has a large break in the side and map the distribution of strain in 3D by computing distortion fields from high-resolution potential images of each slice. In the defect-free nanoparticle, we observe twisting of the shell, while in the broken nanoparticle we measure the 3D position of the crack, the core, and dislocations. These results highlight the advantage of multislice electron ptychography to recover 3D information from a single scan, even under strict electron dose requirements from beam-sensitive samples.

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