基于铁电场效应晶体管的概率比特用于随机计算
Probabilistic-Bits based on Ferroelectric Field-Effect Transistors for Stochastic Computing
AI总结：
本文首次提出基于铁电场效应晶体管的概率比特，利用热噪声诱导的偶极子波动产生可调随机比特流，并通过整数分解验证功能，兼具低成本与CMOS兼容性。
摘要：
概率比特（p-bit）是随机计算电路网络中的基本构建单元，能够产生具有可调概率的连续随机比特流。利用少畴铁电材料（FE）中的随机性，我们首次提出了基于铁电FET的p-bit。FE p-bit的随机性源于热噪声引起的晶格振动，这导致偶极子波动，并可通过外部电场进行调节。评估了若干关键FE参数对p-bit随机性的影响，其中畴特性被揭示起关键作用。此外，基于FE p-bit电路网络的整数分解被实施以验证其功能，发现其精度依赖于FE p-bit的随机性。所提出的FE p-bit兼具极低硬件成本和与CMOS工艺兼容的优势，使其成为随机计算应用的有前景候选。
英文摘要：
A probabilistic-bit (p-bit) is the fundamental building block in the circuit network of a stochastic computing, and it could produce a continuous random bit-stream with tunable probability. Utilizing the stochasticity in few-domain ferroelectric material(FE), we propose for the first time, the p-bits based on ferroelectric FET. The stochasticity of the FE p-bits stems from the thermal noise-induced lattice vibration, which renders dipole fluctuations and is tunable by an external electric field. The impact of several key FE parameters on p-bits' stochasticity is evaluated, where the domain properties are revealed to play crucial roles. Furthermore, the integer factorization based on FE p-bits circuit network is performed to verify its functionality, and the accuracy is found to depend on FE p-bits' stochasticity. The proposed FE p-bits possess the advantages of both extremely low hardware coast and the compatibility with CMOS-technology, rendering it a promising candidate for stochastic computing applications.
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