高分辨X射线谱中高本底线发射探测的新方法
A novel approach to detect line emission under high background in high-resolution X-ray spectra
摘要：
我们开发了一种新的统计方法来识别发射功能或设置上限的高分辨率光谱中存在的高背景。该方法依赖于使用平滑测试检测与背景的差异，并使用经典的似然比测试来识别已知的形状，如发射线。我们进行信号检测或放置线通量的上限，同时考虑多重比较的问题。我们通过将其应用于Chandra LETGS+HRC-S观测共生星RT Cru来说明该方法，成功地检测到先前已知的功能，如6-7 keV范围内的Fe线发射和由于Chandra上的镜面涂层而产生的铱边缘。我们寻找从Ne X，Fe XVII，O VIII和O VII的热发射线，但没有检测到它们，并将其强度的上限与$\approx$ 1千电子伏等离子体一致。我们偶然在16.93 $\unicode{x212B}$处检测到一条线，我们将其归因于光电离或反射成分。
英文摘要：
We develop a novel statistical approach to identify emission features or set upper limits in high-resolution spectra in the presence of high background. The method relies on detecting differences from the background using smooth tests and using classical likelihood ratio tests to characterise known shapes like emission lines. We perform signal detection or place upper limits on line fluxes while accounting for the problem of multiple comparisons. We illustrate the method by applying it to a Chandra LETGS+HRC-S observation of symbiotic star RT Cru, successfully detecting previously known features like the Fe line emission in the 6-7 keV range and the Iridium-edge due to the mirror coating on Chandra. We search for thermal emission lines from Ne X, Fe XVII, O VIII, and O VII, but do not detect them, and place upper limits on their intensities consistent with a $\approx$1 keV plasma. We serendipitously detect a line at 16.93 $\unicode{x212B}$ that we attribute to photoionisation or a reflection component.
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