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arXiv 2302.00447hep-exphysics.ins-det
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利用μ子层析成像研究低Z到高Z材料的与密度无关的散射角和能量损失

Study of density independent scattering angle and energy loss for low- to high-Z material using Muon Tomography

Bharat Kumar Sirasva, Satyajit Jena, Rohit Gupta

摘要:

宇宙射线μ子在穿过物质时会经历多重库仑散射(MCS)。材料中μ子散射角的分析为我们提供了一个研究材料特性及其内部三维结构的机会,因为散射角取决于原子序数,材料的密度,以及在给定能量下介质的厚度。我们使用GEANT4工具包来研究散射角,并利用这些信息来识别材料。我们分析了密度依赖的$\&$密度无关的散射角,并观察到不同的周期在周期表中的各种模式。

英文摘要:

Cosmic ray muon, as they pass through a material, undergoes Multiple Coulomb Scattering (MCS). The analysis of muon scattering angle in a material provides us with an opportunity to study the characteristics of material and its internal 3D structure as the scattering angle depends on the atomic number, the density of the material, and the thickness of the medium at a given energy. We have used the GEANT4 toolkit to study the scattering angle and utilize this information to identify the material. We have analyzed the density dependent $\&$ density independent scattering angle and observed various patterns for distinct periods in the periodic table.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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