超导体-拓扑绝缘体异质结构中反常电阻行为的电流重分布模型
Current redistribution model of anomalous resistance behaviour in superconductor-topological insulator heterostructures
摘要：
在超导体-拓扑绝缘体（TI）（NbN-Bi_（1. 95）Sb_（0. 05）Se_3）异质结构中，在距离界面~ mm尺度处，观察到了拓扑绝缘体（TI）表面电阻的异常上升和下降。进行磁输运测量，以验证异常是由于NbN层的超导转变引起的。由于在NbN-Au和NbN-Al异质结中观察到类似的反常现象，排除了由于自旋极化的TI表面态引起的长程超导邻近效应的可能性。研究发现，这种反常的电阻跳变是由于电流在超导体-TI界面处的几何效应引起的再分布引起的。利用COMSOL软件包进行有限元分析得到的结果验证了所提出的电流再分布（CRD）模型的超导TI和超导金属异质结的长程电阻异常。
英文摘要：
Anomalous resistance upturn and downturn have been observed on the topological insulator (TI) surface in superconductor-TI (NbN-Bi1.95Sb0.05Se3) heterostructures at ~ mm length scales away from the interface. Magnetotransport measurements were performed to verify that the anomaly is caused due to the superconducting transition of the NbN layer. The possibility of long range superconducting proximity effect due to the spin-polarized TI surface state was ruled out due to the observation of similar anomaly in NbN-Au and NbN-Al heterostructures. It was discovered that the unusual resistance jumps were caused due to current redistribution at the superconductor-TI interface on account of the geometry effects. Results obtained from finite element analysis using COMSOL package has validated the proposed current redistribution (CRD) model of long range resistance anomalies in superconductor-TI and superconductor-metal heterostructures.
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