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arXiv 2203.07025cond-mat.mes-hallcond-mat.mtrl-sciphysics.app-phphysics.optics
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二维材料的纳米力学光谱学

Nanomechanical spectroscopy of 2D materials

Jan N. Kirchhof, Yuefeng Yu, Gabriel Antheaume, Georgy Gordeev, Denis Yagodkin, Peter Elliott, Daniel B. de Araújo, Sangeeta Sharma, Stephanie Reich, Kirill I. Bolotin

摘要:

我们介绍了一种纳米机械平台,用于快速和灵敏地测量二维材料的光谱分辨光学介电函数。我们方法的核心是将悬浮的2D材料集成到由波长可调激光源照射的纳米机械谐振器中。从加热相关的频率偏移的谐振腔,以及其作为光子能量的函数测量的光学反射,我们得到的介电函数的实部和虚部。我们的测量不受衬底相关的筛选,不需要任何假设的基础上的光学常数。这种快速($τ_{rise}$ $\sim$ 135 ns)、灵敏(噪声等效功率= 90 $\frac{pW}{\sqrt{Hz}}$)和宽带(1.2 $-$ 3.1 eV,可扩展到UV-THz)方法提供了光谱或椭圆偏振表征技术的有吸引力的替代方案。

英文摘要:

We introduce a nanomechanical platform for fast and sensitive measurements of the spectrally-resolved optical dielectric function of 2D materials. At the heart of our approach is a suspended 2D material integrated into a nanomechanical resonator illuminated by a wavelength-tunable laser source. From the heating-related frequency shift of the resonator as well as its optical reflection measured as a function of photon energy, we obtain the real and imaginary parts of the dielectric function. Our measurements are unaffected by substrate-related screening and do not require any assumptions on the underling optical constants. This fast ($τ_{rise}$ $\sim$ 135 ns), sensitive (noise-equivalent power = 90 $\frac{pW}{\sqrt{Hz}}$ ), and broadband (1.2 $-$ 3.1 eV, extendable to UV-THz) method provides an attractive alternative to spectroscopic or ellipsometric characterisation techniques.

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