高吸收样品的微米空间分辨率X射线衍射
X-ray diffraction with micrometer spatial resolution for highly absorbing samples
摘要：
具有高空间分辨率的X射线衍射通常用于表征（多）晶样品，例如关于局部应变、残余应力、晶界和织构。然而，高吸收样品的调查或高Z材料的X射线荧光的同时评估已受到限制，由于利用低光子能量。在这里，我们报告在PETRA III的P06光束线，允许微米空间分辨率与光子能量为35千电子伏及以上的角度计为基础的设置。通过使用复合折射透镜实现了高度聚焦的光束，并且通过允许高达5D扫描（3次旋转和2次平移）的测角仪实现了高精度的样品操作。作为实验的例子，我们展示了马氏体钢样品的局部应变变化与微米空间分辨率的测定，以及同时元素分布的高Z材料的薄膜太阳能电池。我们提出的方法允许用户从材料科学社区，以确定即使在高吸收样品的微观结构特性。
英文摘要：
X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilisation of low photon energies. Here, we report on a goniometer-based setup implemented at the P06 beamline of PETRA III that allows for micrometer spatial resolution with a photon energy of 35 keV and above. A highly focused beam was achieved by using compound refractive lenses and high precision sample manipulation was enabled by a goniometer that allows for up to 5D scans (3 rotations & 2 translations). As experimental examples, we demonstrate the determination of local strain variations in martensitic steel samples with micrometer spatial resolution as well as the simultaneous elemental distribution for high-Z materials in a thin film solar cell. Our proposed approach allows users from the materials science community to determine micro-structural properties even in highly absorbing samples.
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