编码孔径深度分辨劳厄微衍射
Depth-resolved Laue microdiffraction with coded-apertures
摘要：
我们介绍了一种快速的数据采集和重建方法来成像材料的晶体结构和相关的应变和取向在微米分辨率使用劳厄衍射。我们的方法依赖于扫描编码孔径的衍射X射线光束从宽带照明，和重建算法来解决劳厄微衍射图案作为沿入射照明路径的深度的函数。这种方法提供了一个快速访问完整的衍射信息在亚微米体积元素在散装材料。在这里，我们提出的理论以及这种成像方法的实验验证。
英文摘要：
We introduce a rapid data acquisition and reconstruction method to image the crystalline structure of materials and associated strain and orientations at micrometer resolution using Laue diffraction. Our method relies on scanning a coded-aperture across the diffracted x-ray beams from a broadband illumination, and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. This method provides a rapid access to full diffraction information at sub-micrometer volume elements in bulk materials. Here we present the theory as well as the experimental validation of this imaging approach.
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