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arXiv 2201.12111cond-mat.mtrl-sciphysics.app-ph
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一种新的空间扫描热反射法用于测量宽范围各向异性面内热导率

A new spatial-scan thermoreflectance method to measure a broad range of anisotropic in-plane thermal conductivity

Puqing Jiang, Dihui Wang, Zeyu Xiang, Ronggui Yang, Heng Ban

AI总结:

提出一种新的空间扫描热反射法,将可测面内热导率下限扩展至1 W/(m·K),并成功测量各向异性材料,精度高且操作简便。

摘要:

小尺度样品的面内热导率难以测量,尤其是对于低导热性样品和缺乏面内对称性的样品(即横向各向异性材料)。最先进的泵浦-探测技术,包括时域和频域热反射法(TDTR和FDTR),在测量小尺度样品的热导率方面具有优势,并且已经开发了各种先进的TDTR和FDTR技术来测量横向各向异性材料。然而,可测量的面内热导率(k_in)通常限制在大于10 W/(m·K)。在本工作中,开发了一种新的空间扫描热反射(SSTR)方法,用于测量毫米级小样品的宽范围k_in,包括那些缺乏面内对称性的样品,将当前可测量的k_in极限扩展到低至1 W/(m·K)。该SSTR方法建立了使用优化激光光斑尺寸和调制频率的新测量方案以及新的数据处理方案,使得能够以高精度和操作简便性测量宽范围k_in值的面内热导率张量。还讨论了一些细节,如样品几何形状的要求、换能器层的影响以及热损失的影响。作为验证,使用这种新的SSTR方法测量了具有宽范围k_in值的横向各向同性参考样品,包括熔融石英、蓝宝石、硅和高定向热解石墨(HOPG)。测量的k_in与文献值非常吻合,典型不确定度为5%。作为该方法独特能力的演示,还测量了面内各向异性材料x切石英的面内热导率张量。

英文摘要:

In-plane thermal conductivities of small-scale samples are hard to measure, especially for the lowly conductive ones and those lacking in-plane symmetry (i.e., transversely anisotropic materials). State-of-the-art pump-probe techniques including both the time-domain and the frequency-domain thermoreflectance (TDTR and FDTR) are advantageous in measuring the thermal conductivity of small-scale samples, and various advanced TDTR and FDTR techniques have been developed to measure transversely anisotropic materials. However, the measurable in-plane thermal conductivity (k_in) is usually limited to be >10 W/(m K). In this work, a new spatial-scan thermoreflectance (SSTR) method has been developed to measure a broad range of k_in of millimeter-scale small samples, including those lacking in-plane symmetry, extending the current limit of the measurable k_in to as low as 1 W/(m K). This SSTR method establishes a new scheme of measurements using the optimized laser spot size and modulation frequency and a new scheme of data processing, enabling measurements of in-plane thermal conductivity tensors of a broad range of k_in values with both high accuracy and ease of operation. Some details such as the requirement on the sample geometry, the effect of the transducer layer, and the effect of heat loss are also discussed. As a verification, the k_in of some transversely isotropic reference samples with a wide range of k_in values including fused silica, sapphire, silicon, and highly ordered pyrolytic graphite (HOPG) have been measured using this new SSTR method. The measured k_in agree perfectly well with the literature values with a typical uncertainty of 5%. As a demonstration of the unique capability of this method, the in-plane thermal conductivity tensor of x-cut quartz, an in-plane anisotropic material, has also been measured.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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